Category
Books
Store
BSI
BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells|Resistors, Transistors, Testing methods, Performance testing, Semiconductor devices
20 GBP
Choose your language and region
Klarna is available around the world with a variable offering, choose one that suits you best.
Copyright © 2005-2026 Klarna Bank AB (publ). Headquarters: Stockholm, Sweden. All rights reserved. Klarna Bank AB (publ). Sveavägen 46, 111 34 Stockholm. Organization number: 556737-0431