Nano-CMOS Gate Dielectric Engineering By Wong, Hei 9781439849590

Category

Electrical engineering

Store

Wordery

Brand

Crc press

Nano-CMOS Gate Dielectric Engineering : CRC Press : 9781439849590 : 1439849595 : 13 Jan 2012 : According to Moore's Law, not only does the number of transistors in an integrated circuit double every two years, but transistor size also decreases at a predictable rate. At the rate we are going, the downsizing of CMOS transistors will reach the deca-nanometer scale by 2020. Accordingly, the gate dielectric thickness will be shrunk to less than half-nanometer oxide equivalent thickness (EOT) to maintain proper operation of the transistors, leaving high-k materials as the only viable solution for such small-scale EOT. This comprehensive, up-to-date text covering the physics, materials, devices, and fabrication processes for high-k gate dielectric materials, Nano-CMOS Gate Dielectric Engineering systematically describes how the fundamental electronic structures and other material properties of the transition metals and rare earth metals affect the electrical properties of the dielectric f

110 GBP