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Teknik, industri & it
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Bookhero
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A s m international
The theme for the 2021 conference was System-in-Package (SiP) technology. Papers include discussions on board and system level failure analysis; detecting counterfeit microelectronics; emerging failure analysis techniques and concepts; future challenges of failure analysis; and scanning probe analysis. Format Häftad Omfång 461 sidor Språk Engelska Förlag A S M International Utgivningsdatum 2022-07-30 ISBN 9781627084192
2439 SEK
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