Category
Electronics & communications e
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Wordery
Brand
Wiley?blackwell
Ionizing Radiation Effects in MOS Devices and Circ Circuits : Wiley?Blackwell : 9780471848936 : 047184893X : 07 Jun 1989 : The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
287.95 GBP
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